AI-driven smart jig can detect micro-level defects in just 2.79 seconds

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting-edge technology facilitates real-time, micron-scale defect detection during continuous manufacturing processes, paving the way for fully automated, inline quality control in high-speed production environments.