{"id":6929,"date":"2025-09-18T04:02:24","date_gmt":"2025-09-18T04:02:24","guid":{"rendered":"https:\/\/mailitics.com\/index.php\/2025\/09\/18\/ai-driven-smart-jig-can-detect-micro-level-defects-in-just-2-79-seconds\/"},"modified":"2025-09-18T04:02:24","modified_gmt":"2025-09-18T04:02:24","slug":"ai-driven-smart-jig-can-detect-micro-level-defects-in-just-2-79-seconds","status":"publish","type":"post","link":"https:\/\/mailitics.com\/index.php\/2025\/09\/18\/ai-driven-smart-jig-can-detect-micro-level-defects-in-just-2-79-seconds\/","title":{"rendered":"AI-driven smart jig can detect micro-level defects in just 2.79 seconds"},"content":{"rendered":"<p>    AI-driven smart jig can detect micro-level defects in just 2.79 seconds<br \/>\n \t<BR><br \/>\n<BR><\/BR><br \/>\n    <!-- no image --><br \/>\n \t<BR><br \/>\n<BR><\/BR><\/p>\n<div>A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting-edge technology facilitates real-time, micron-scale defect detection during continuous manufacturing processes, paving the way for fully automated, inline quality control in high-speed production environments.<\/div>\n<p> \t<BR><br \/>\n <BR><\/BR><\/p>\n<p> \t<BR><br \/>\n<BR><\/BR><br \/>\n<a href=\"https:\/\/techxplore.com\/news\/2025-09-ai-driven-smart-jig-micro.html\">Go to techxplore<\/a><br \/>\n \t<BR><br \/>\n <BR><\/BR><\/p>\n","protected":false},"excerpt":{"rendered":"<p>AI-driven smart jig can detect micro-level defects in just 2.79 seconds A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting-edge technology facilitates real-time, micron-scale defect detection during continuous manufacturing processes, paving the way for fully [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[49,45],"tags":[50],"class_list":["post-6929","post","type-post","status-publish","format-standard","hentry","category-engineering","category-techxplore","tag-techxplore"],"_links":{"self":[{"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/posts\/6929"}],"collection":[{"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/comments?post=6929"}],"version-history":[{"count":0,"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/posts\/6929\/revisions"}],"wp:attachment":[{"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/media?parent=6929"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/categories?post=6929"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/mailitics.com\/index.php\/wp-json\/wp\/v2\/tags?post=6929"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}